In response to the phenomenon of data "hanging upside down" in the storage test of initiating explosive devices, a dynamic distribution parameter analysis method is used to obtain prior information of the "hanging upside down" test data using reliable test data points. Bayes theory is used to correct the "hanging upside down" test data, and a storage reliability degradation model is established based on the corrected initiating explosive device test data to obtain the storage life of the initiating explosive device. This method is based on reasonable engineering experience to obtain a more reliable storage life for initiating explosive devices.